Список сокращений и обозначений

    A
AED Auger electron diffraction --- (ru) Дифракция Оже-Электронов
AES - Auger Electron Spectroscopy --- (ru) Электронная Оже-Спектроскопия (ЭОС)
AR-EELS - Angle-resolved electron energy loss spectroscopy --- (ru) Спектроскопия Характеристических Потерь Энергии Электронами (ХПЭЭ) c угловым разрешением
ARAES - Angle-resolved Auger electron spectroscopy --- (ru) Электронная Оже-Спектроскопия (ЭОС) c угловым разрешением
ARPES Angle-resolved photoelectron spectroscopy
--- ФотоЭлектронная Спектроскопия (ФЭС) c угловым разрешением
ARUPS Angle-resolved ultraviolet photoelectron spectroscopy
--- Ультрафиолетовая Фотоэлектронная Спектроскопия (УФЭС) c угловым разрешением
    B
    C
CAICISS Co-axial impact collision ion scattering spectroscopy
CITS Current imaging tunneling spectroscopy
--- Туннельная спектроскопия
    D
    E
EELS - Electron Energy Loss Structure
--- Спектроскопия Характеристических Потерь Энергии Электронами (ХПЭЭ)
    H
HREELS High resolution electron energy loss spectroscopy
--- Спектроскопия Характеристических Потерь Энергии Электронами (ХПЭЭ) с высоким разрешением
    I
IAES Ion-induced Auger electron spectroscopy
--- Ионно Индуцированная Электронная Оже Спектроскопия
ICISS Impact-collision ion-scattering spectroscopy
IPES Inverse photoemission spectroscopy
ISS Ion scattering spectroscopy
    K
KRIPES K-Resolved inverse photoelectron spectroscopy
    L
LEED Low-energy electron diffraction
LEEM Low-energy electron microscopy
LEIS Low-energy ion spectroscopy
    M
MBE Molecular beam epitaxy
MDS Metastable-atom de-exitation spectroscopy
MEED Medium-energy electron diffraction
MEIS Medium-energy ion spectroscopy
    N
NICISS Neutral impact collision ion scattering spectroscopy
    P
PEH Photoelectron holography
PEM Photoelectrom microscopy
PES Photoelectron spectroscopy
PYS Photoelectron yield spectroscopy
    Q
QMS Quadrupole mass spectroscopy
    R
RAS Reflectance anisotropy spectroscopy
RBS Rutherford backscattering spectroscopy
RDS Reflectance difference spectroscopy
REM Reflection electron microscopy
RHEED Reflection high-energy electron diffraction
RMEED Reflection medium-energy diffraction
RS Raman scattering
    S
SAM Scanning Auger microscopy
SDR Surface differential reflectivity
SE Spectroscopic ellipsometry
SEM Scanning electron microscopy
SEXAFS Surface extended X-ray absorption fine structure
SIMS Secondary ion mass spectrometry
SPA-LEED Spot profile analysis - low energy electron diffraction
SPEM Scanning photoemission microscopy
SSM Surface stress measurements
STM Scanning tunneling microscopy
STS Scanning tunneling spectroscopy
    T
TDS Thermal desorption spectroscopy
TED Transmission electron diffraction
TEM Transmission electron microscopy
TPD Temperature-programmed desorption
TRAXS Total reflection angle X-ray spectroscopy
    U
UPS Ultra-violet photoelectron spectroscopy
    W
WFM Work function measurements
    X
XAS X-ray absorption spectroscopy
XPD X-ray photoelectron diffraction
XPS X-ray photoelectron spectroscopy
XRD X-ray diffraction
XRR X-ray reflectivity
XSW X-ray standing wave spectroscopy